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Lahsen Assoufid
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Advances in Metrology for X-Ray and EUV Optics : 2-3 August, 2005, San Diego, California, USA
Author:
J. S. Taylor
,
Peter Z. Takacs
,
Lahsen Assoufid
Editions
(1 of 1)
Advances in Metrology for X-ray and Euv Optics (Proceedings of Spie)
Author:
Lahsen Assoufid
,
Peter Z. Takacs
,
J. S. Taylor
Paperback
8/31/2005
SPIE-International Society for Optical Engine
ISBN10 : 0819459267
ISBN13 : 9780819459268
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