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Lahsen Assoufid
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Records 1 - 2 of 2
Books
(2 of 2)
Advances in Metrology for X-Ray and EUV Optics II : 30 August 2007, San Diego, California, USA
2007
Author:
Lahsen Assoufid
,
Peter Z. Takacs
,
Masaru Ohtsuka
Subject:
Science / Physics
Advances in Metrology for X-Ray and EUV Optics : 2-3 August, 2005, San Diego, California, USA
2005
Author:
J. S. Taylor
,
Peter Z. Takacs
,
Lahsen Assoufid
Subject:
Mathematics / Mensuration
Subject:
Science / Optics
Subject:
Technology & Engineering / Mensuration
Subject:
Technology & Engineering / Optics
Records 1 - 2 of 2
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